IEEE - Institute of Electrical and Electronics Engineers, Inc. - Catastrophic Failures in Semiconductor Devices Exposed to Pulsed Radiation

Author(s): DeWitt Landis
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1966
Volume: 13
Page(s): 591 - 600
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1966.4324146
Regular:

Semiconductor devices were exposed to high intensity 1.6 MeV electron pulses. Glass diode packages and integrated circuit chips were broken. However, the failure occurring at the lowest radiation... View More

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