IEEE - Institute of Electrical and Electronics Engineers, Inc. - "Gap Effect" in Measurement of Large Permittivities (Correspondence)

Author(s): K.S. Champlin ; G.H. Glover
Sponsor(s): IEEE Microwave Theory and Techniques Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1966
Volume: 14
Page(s): 397 - 398
ISSN (Paper): 0018-9480
ISSN (Online): 1557-9670
DOI: 10.1109/TMTT.1966.1126280
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