IEEE - Institute of Electrical and Electronics Engineers, Inc. - A normalized stability plot for tunnel diode shunted by resistance and capacitance

Author(s): M. Rasiukiewicz
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1965
Volume: 53
Page(s): 619 - 620
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/PROC.1965.3933
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