IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Measurement of Narrow Magnetic-Resonance Linewidths

Author(s): Joseph Nemarich
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 1965
Volume: IM-14
Page(s): 33 - 39
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.1965.4313438
Regular:

A discussion is given of the origin of various errors that may occur in the measurement by cavity perturbation techniques of narrow magnetic-resonance linewidths. It is shown that the absorption... View More

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