IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semiconductor network reliability assessment

Author(s): J. Adams ; W. Workman
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1964
Volume: 52
Page(s): 1,624 - 1,635
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/PROC.1964.3457
Regular:

The paper discusses the reliability test plan and test results on semiconductor network microelectronic devices. Included in the test plan are reliability programs, life testing, step stress... View More

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