IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Quantitative Analysis of Semiconductor Device Failure Rates as Graphically Indicated in Military Handbook 217

Author(s): Steven K. Morrison
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1964
Volume: R-13
Page(s): 33 - 41
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1964.5214854
Regular:

A graphical presentation of semiconductor device failure rates is made in Figs. 13B and 14B of Mil-Hdbk-217 (see Figs. 1 and 2). From this presentation, Equations may be derived which indicate... View More

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