IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determination of Transient Response of Semiconductor Detectors by Use of a Nanosecond-Pulse Electron Accelerator

Author(s): Harry M. Mann ; Irvin S. Sherman
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1964
Volume: 11
Page(s): 271 - 275
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.1964.4323433
Regular:

An apparatus previously developed and used for determination of scintillator response characteristics has been used for similar studies of the transient response of semiconductor nuclear... View More

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