IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and Design of Finite Alphabet Iterative Decoders Robust to Faulty Hardware

Author(s): Elsa Dupraz ; David Declercq ; Bane Vasic ; Valentin Savin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Volume: 63
Page(s): 2,797 - 2,809
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOMM.2015.2452259
Regular:

This paper addresses the problem of designing low-density parity check decoders robust to transient errors introduced by faulty hardware. We assume that the faulty hardware introduces errors... View More

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