IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes

Author(s): A. Ganguly ; D. Kundu ; S. Mitra
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2015
Volume: 64
Page Count: 13
Page(s): 473 - 485
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.2014.2368871
Regular:

The step-stress model is becoming quite popular for analyzing lifetime data obtained from accelerated life testing experiments. In the usual step-stress experiment, stress levels are allowed to... View More

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