IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian Reliability and Performance Assessment for Multi-State Systems

Author(s): Yu Liu ; Peng Lin ; Yan-Feng Li ; Hong-Zhong Huang
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2015
Volume: 64
Page Count: 16
Page(s): 394 - 409
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.2014.2366292
Regular:

This paper develops a Bayesian framework to assess the reliability and performance of multi-state systems (MSSs). An MSS consists of multiple multi-state components of which the degradation... View More

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