IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Reliability of a Worst Case Designed Nonredundant Circuit

Author(s): C. A. Combs
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1963
Volume: R-12
Page(s): 11 - 14
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1963.5218223
Regular:

A worst case designed circuit is defined and, based on observed component failure modes, a mathematical model for circuit reliability is obtained. A special case of the general model is then... View More

Advertisement