IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in ${\rm TaO}_{\rm x}$ Memristors

Author(s): David R. Hughart ; Jose L. Pacheco ; Andrew J. Lohn ; Patrick R. Mickel ; Edward Bielejec ; Gyorgy Vizkelethy ; Barney L. Doyle ; Steven L. Wolfley ; Paul E. Dodd ; Marty R. Shaneyfelt ; Michael L. McLain ; Matthew J. Marinella
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2014
Volume: 61
Page Count: 7
Page(s): 2,965 - 2,971
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2014.2365139
Regular:

The locations of conductive regions in TaOx memristors are spatially mapped using a microbeam and Nanoimplanter by rastering an ion beam across each device while monitoring its... View More

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