IEEE - Institute of Electrical and Electronics Engineers, Inc. - Verification of Reconfigurable Binary Decision Diagram-Based Single-Electron Transistor Arrays

Author(s): Yung-Chih Chen ; Chun-Yao Wang ; Ching-Yi Huang
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2013
Volume: 32
Page Count: 11
Page(s): 1,473 - 1,483
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2013.2267453
Regular:

Recently, single-electron transistors (SETs) have been attracting substantial attention and are considered candidate devices for future integrated circuits due to their ultralow power consumption.... View More

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