IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fluorescence-Assisted Gamma Spectrometry for Surface Contamination Analysis

Author(s): S. Ihantola ; J. Sand ; K. Perajarvi ; J. Toivonen ; H. Toivonen
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2013
Volume: 60
Page Count: 5
Page(s): 305 - 309
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2013.2238249
Regular:

A fluorescence-based alpha-gamma coincidence spectrometry approach has been developed for the analysis of alpha-emitting radionuclides. The thermalization of alpha particles in air produces UV... View More

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