IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Dislocation Walls on Image Quality When Using Cadmium Telluride X-Ray Detectors

Author(s): C. Buis ; G. Marrakchi ; T. A. Lafford ; A. Brambilla ; L. Verger ; E. Gros d'Aillon
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2013
Volume: 60
Page Count: 5
Page(s): 199 - 203
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2012.2232306
Regular:

Microstructural defects in chlorine-doped cadmium telluride crystals (CdTe:Cl) can affect performance of CdTe-based radiation detectors. To study this, we produced a CdTe-based X-ray detector... View More

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