IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploiting Process Variation and Noise in Comparators to Calibrate Interstage Gain Nonlinearity in Pipelined ADCs

Author(s): Nan Sun
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2012
Volume: 59
Page Count: 11
Page(s): 685 - 695
ISSN (Paper): 1549-8328
ISSN (Online): 1558-0806
DOI: 10.1109/TCSI.2011.2169854
Regular:

This paper presents a digital background calibration technique that intentionally exploits process variation and noise in comparators to correct conversion errors caused by interstage gain error,... View More

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