IEEE - Institute of Electrical and Electronics Engineers, Inc. - Artifact-Free Despeckling of SAR Images Using Contourlet

Author(s): Ran Tao ; Hui Wan ; Yue Wang
Sponsor(s): IEEE Geoscience and Remote Sensing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2012
Volume: 9
Page Count: 5
Page(s): 980 - 984
ISSN (Paper): 1545-598X
ISSN (Online): 1558-0571
DOI: 10.1109/LGRS.2012.2187427
Regular:

Contourlets have been attracting increasing attention in despeckling of synthetic aperture radar (SAR) images in recent years. However, contourlets produce undesirable artifacts while despeckling.... View More

Advertisement