IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analyzing UV/Vis/NIR Spectra-Sputtered ZnO:Al Thin-Films III: Plasma-Parameter Dep.

Author(s): A. Stadler
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2012
Volume: 25
Page Count: 7
Page(s): 19 - 25
ISSN (Paper): 0894-6507
ISSN (Online): 1558-2345
DOI: 10.1109/TSM.2011.2174388
Regular:

Exact, contact-free, and nondestructive optoelectrical analysis of transparent conductive oxide layers have been discussed within this tripartite publication, in view of solar cell production. In... View More

Advertisement