IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel Outlier Filtering Method for AOI Image Databases

Author(s): T. Takacs ; L. Vajta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2012
Volume: 2
Page Count: 10
Page(s): 700 - 709
ISSN (Paper): 2156-3950
ISSN (Online): 2156-3985
DOI: 10.1109/TCPMT.2012.2184765
Regular:

Automated optical inspection (AOI) systems are essential in electronic manufacturing technology. These systems can inspect the products' quality quickly, accurately and without weariness. However,... View More

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