IEEE - Institute of Electrical and Electronics Engineers, Inc. - Thermal performance of CMOS-SOI transistors from weak to strong inversion

Author(s): M. Malits ; D. Corcos ; A. Svetlitza ; D. Elad ; Y. Nemirovsky
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2012
Volume: 15
ISSN (Paper): 1094-6969
DOI: 10.1109/MIM.2012.6314512
Regular:

A promising solution to continue the complementary metal-oxide semiconductor (CMOS) scaling roadmap at the 22 nm technology node and beyond is CMOS-silicon on insulator (SOI), which is used... View More

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