IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Highly Sensitive Optical Sensor Design by Integrating a Circular-Hole Defect With an Etched Diffraction Grating Spectrometer on an Amorphous-Silicon Photonic Chip

Author(s): J. Song ; Y. Z. Li ; X. Zhou ; X. Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2012
Volume: 4
Page(s): 317 - 326
ISSN (CD): 1943-0647
ISSN (Electronic): 1943-0655
DOI: 10.1109/JPHOT.2012.2188097
Regular:

We present a sensitive optical sensor design by integrating a circular-hole defect with an etched diffraction grating (EDG) spectrometer based on amorphous-silicon photonic platforms. The... View More

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