IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Analytical Model for Single Event (SE) Crosstalk

Author(s): Baojun Liu ; Li Cai ; Jing Zhu
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2012
Volume: 59
Page Count: 7
Page(s): 1,621 - 1,627
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2012.2204901
Regular:

With advances in modern technology, circuits become more sensitive to single event transient (SET) due to decreased device feature size and increased coupling effects among interconnects, which... View More

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