IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analytical Modeling of Single Event Transients Propagation in Combinational Logic Gates

Author(s): Xavier Gili ; Salvador Barcelo ; Sebasti à A. Bota ; Jaume Segura
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2012
Volume: 59
Page Count: 9
Page(s): 971 - 979
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2012.2187071
Regular:

We present a single event transient (SET) propagation model that can be used to quantify the propagation likelihood of a given noise waveform trough CMOS logic gates. This analysis is key to... View More

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