IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Point Insertion with Control Points Driven by Existing Functional Flip-Flops

Author(s): Joon-Sung Yang ; N. A. Touba ; B. Nadeau-Dostie
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2012
Volume: 61
Page(s): 1,473 - 1,483
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2011.189
Regular:

This paper presents a novel test point insertion method for pseudorandom built-in self-test (BIST) to reduce the area overhead. The proposed method replaces dedicated flip-flops for driving... View More

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