IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Routing-Aware ILS Design Technique

Author(s): S. Banerjee ; J. Mathew ; D. K. Pradhan ; B. B. Bhattacharya ; S. P. Mohanty
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2011
Volume: 19
Page Count: 4
Page(s): 2,335 - 2,338
ISSN (Paper): 1063-8210
ISSN (Online): 1557-9999
DOI: 10.1109/TVLSI.2010.2078526
Regular:

The Illinois Scan Architecture (ILS) consists of several scan path segments and is useful in reducing test application time and test data volume for high density chips. In this paper, we propose a... View More

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