IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Correlation-Based Background Error Estimation Technique for Bandpass Delta–Sigma ADC DACs

Author(s): P. Witte ; J. G. Kauffman ; J. Becker ; M. Ortmanns
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2011
Volume: 58
Page Count: 5
Page(s): 748 - 752
ISSN (Paper): 1549-7747
ISSN (Online): 1558-3791
DOI: 10.1109/TCSII.2011.2168021
Regular:

This brief presents a background digital-to-analog converter (DAC) error estimation technique for multibit bandpass Delta-Sigma analog-to-digital converters (ΔΣ ADCs). The technique is... View More

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