IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting Fall Risk Factors for Toddlers
|Author(s):||Hana Na ; Shengfeng Qin ; D Wright|
|Sponsor(s):||IEEE Computer Society|
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 January 2011|
|Page(s):||82 - 89|
A camera-based system detects fall risk factors to help caregivers supervise toddlers. A crucial technical challenge is to differentiate a human from other objects in the images.