IEEE - Institute of Electrical and Electronics Engineers, Inc. - Triggering of Transient Latch-up by System-Level ESD

Author(s): T. Brodbeck ; W. Stadler ; C. Baumann ; K. Esmark ; K. Domanski
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2011
Volume: 11
Page Count: 7
Page(s): 509 - 515
ISSN (Paper): 1530-4388
ISSN (Online): 1558-2574
DOI: 10.1109/TDMR.2011.2165072
Regular:

This paper investigates the influences of temperature and the trigger parameters (width and rise time) on the threshold of transient latch-up (TLU). It is shown that temperature is a much more... View More

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