IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise Characterization of an Injection-Locked COEO With Long-Term Stabilization

Author(s): C. Williams ; J. Davila-Rodriguez ; D. Mandridis ; P. J. Delfyett
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2011
Volume: 29
Page Count: 7
Page(s): 2,906 - 2,912
ISSN (Paper): 0733-8724
ISSN (Online): 1558-2213
DOI: 10.1109/JLT.2011.2164514
Regular:

Extensive noise analysis is presented of a semiconductor-based coupled opto-electronic oscillator using continuous-wave optical injection for the generation of an optical frequency comb with 10.24... View More

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