IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mapping Impervious Cover Using Multi-Temporal MODIS NDVI Data

Author(s): J Knight ; M Voth
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2011
Volume: 4
Page Count: 7
Page(s): 303 - 309
ISSN (Paper): 1939-1404
ISSN (Online): 2151-1535
DOI: 10.1109/JSTARS.2010.2051535
Regular:

Mapping impervious surfaces over regional or continental scale study areas with high spatial resolution imagery is difficult due to the cost and time involved in processing the large number of... View More

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