IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains

Author(s): P. E. Dodd ; M. R. Shaneyfelt ; R. S. Flores ; J. R. Schwank ; T. A. Hill ; D. McMorrow ; G. Vizkelethy ; S. E. Swanson ; S. M. Dalton
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2011
Volume: 58
Page Count: 7
Page(s): 2,695 - 2,701
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2011.2169683
Regular:

Single-event upsets are studied in digital logic cells in a radiation-hardened CMOS SOI technology. The sensitivity of SEU to different strike locations and hardening approaches is explored using... View More

Advertisement