IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of DC Bias Field on the Time-of-Flight Current Waveforms of CdTe and CdZnTe Detectors

Author(s): K. Suzuki ; T. Sawada ; K. Imai
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2011
Volume: 58
Page Count: 6
Page(s): 1,958 - 1,963
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2011.2138719
Regular:

The effect of a DC bias field on the time-of-flight current waveforms of electron and hole drift in CdTe and CdZnTe is reported. Under a DC bias, the electron waveforms show more rapid decay than... View More

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