IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extended Analysis of Capacitance–Voltage Curves for the Determination of Bulk Dopant Concentrations of Textured Silicon Solar Cells

Author(s): M. Schütze ; D. Hinken ; A. Milsted ; M. B. Koentopp ; K. Bothe
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2011
Volume: 58
Page Count: 12
Page(s): 3,759 - 3,770
ISSN (Paper): 0018-9383
ISSN (Online): 1557-9646
DOI: 10.1109/TED.2011.2164079
Regular:

Capacitance-Voltage (C- V) measurements are an established method for determining the bulk dopant concentration Nbulk of semiconductor devices. The extraction of... View More

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