IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust CCD and IR Image Registration Using Gradient-Based Statistical Information

Author(s): Jae Hak Lee ; Yong Sun Kim ; Duhgoon Lee ; Dong-Goo Kang ; Jong Beom Ra
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Volume: 17
Page Count: 4
Page(s): 347 - 350
ISSN (Paper): 1070-9908
ISSN (Online): 1558-2361
DOI: 10.1109/LSP.2010.2040928
Regular:

This letter presents a robust similarity measure for registering charged-couple device (CCD) and infrared (IR) images. The measure is based on the entropy obtained from a 3-D joint histogram... View More

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