IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical mechanisms leading to deterioration of transistor life

Author(s): G.C. Messenger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 1958
Volume: 5
Page(s): 147 - 151
ISSN (Paper): 0096-2430
DOI: 10.1109/T-ED.1958.14411
Regular:

Life tests on surface-barrier-type transistors have been conducted at various temperatures and power levels to identify and characterize the mechanisms which cause the transistor... View More

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