IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Analytical Expression for Threshold Voltage of Polycrystalline-Silicon Thin-Film Transistors

Author(s): Yan Zhou ; Mingxiang Wang ; Dapeng Zhou ; Dongli Zhang ; Man Wong
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2010
Volume: 31
Page Count: 3
Page(s): 815 - 817
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/LED.2010.2050134
Regular:

A physical-based analytical expression for the threshold voltage (Vth) of polycrystalline-silicon (poly-Si) thin-film transistors (TFTs) is proposed, which is based on our... View More

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