IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlation Between TDDB and VRDB for Low- $k$ Dielectrics With Square Root $E$ Model

Author(s): Mingte Lin ; K C Su
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Volume: 31
Page Count: 3
Page(s): 494 - 496
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/LED.2010.2044554
Regular:

A concise relation between voltage ramp dielectric breakdown (VRDB) and time-dependent dielectric breakdown (TDDB) based on the square-root (SQRT) E model for low- k... View More

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