IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mechanical stress aware optimization for leakage power reduction

Author(s): Vivek Joshi ; Brian Cline ; Dennis Sylvester ; David Blaauw ; Kanak Agarwal
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Volume: 29
Page Count: 15
Page(s): 722 - 736
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2010.2042893
Regular:

Process-induced mechanical stress is used to enhance carrier transport and achieve higher drive currents in current complementary metal-oxide-semiconductor technologies. This paper explores... View More

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