IEEE - Institute of Electrical and Electronics Engineers, Inc. - Safety circuit development at Brookhaven

Author(s): J. E. Binns ; W. Lones ; D. G. Pitcher ; M. Melice
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1957
Volume: 76
Page(s): 685
ISSN (Paper): 0095-9197
DOI: 10.1109/EE.1957.6442668
Regular:

IN SPITE OF EFFORTS to design nuclear reactors which will be intrinsically sale from an uncontrolled increase in the rate of power generation, it remains the primary problem of reactor... View More

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