IEEE - Institute of Electrical and Electronics Engineers, Inc. - Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug

Author(s): Ho Fai Ko ; N. Nicolici
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2009
Volume: 28
Page Count: 13
Page(s): 285 - 297
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.2008.2009158
Regular:

To locate and correct design errors that escape pre-silicon verification, silicon debug has become a necessary step in the implementation flow of digital integrated circuits. Embedded logic... View More

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