IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simplified test method for the d-axis transient reactance and time constant

Author(s): C. F. Yohe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1956
Volume: 74
Page(s): 436 - 438
ISSN (Paper): 0097-2185
DOI: 10.1109/TAI.1956.6367125
Regular:

A RELATIVELY simple test method is demonstrated to obtain the transient reactance and time constant of an a-c synchronous generator by an analysis of an oscillogram of the a-c generator field... View More

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