IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Outage Probability of a Multiple-Input Single-Output Communication Link

Author(s): M. Katz ; S. Shamai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2007
Volume: 6
ISSN (Paper): 1536-1276
DOI: 10.1109/TWC.2007.060247
Regular:

We investigate the outage probability of a 2 times 1 multiple-input single-output (MISO) communication link subjected to quasi-static flat Rayleigh fading, under total and individual (per antenna)... View More

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