IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microsimulation of Freeway Ramp Merging Processes Under Congested Traffic Conditions

Author(s): M. Sarvi ; M. Kuwahara
Sponsor(s): IEEE Intelligent Transportation Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2007
Volume: 8
Page Count: 10
Page(s): 470 - 479
ISSN (Paper): 1524-9050
ISSN (Online): 1558-0016
DOI: 10.1109/TITS.2007.895305
Regular:

This paper describes a microsimulation program developed to study freeway ramp merging phenomena under congested traffic conditions. The results of extensive macroscopic and microscopic studies... View More

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