IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data

Author(s): N. Balakrishnan ; A.H. Rad ; N.R. Arghami
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2007
Volume: 56
Page Count: 7
Page(s): 301 - 307
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.2007.895308
Regular:

We express the joint entropy of progressively censored order statistics in terms of an incomplete integral of the hazard function, and provide a simple estimate of the joint entropy of... View More

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