IEEE - Institute of Electrical and Electronics Engineers, Inc. - Solid State Microdosimetry With Heavy Ions for Space Applications

Author(s): A. Wroe ; A. Rosenfeld ; M. Reinhard ; V. Pisacane ; J. Ziegler ; M. Nelson ; F. Cucinotta ; M. Zaider ; J. Dicello
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2007
Volume: 54
Page Count: 8
Page(s): 2,264 - 2,271
ISSN (Paper): 0018-9499
ISSN (Online): 1558-1578
DOI: 10.1109/TNS.2007.910037
Regular:

This work provides information pertaining to the performance of Silicon-On-Insulator (SOI) microdosimeters in heavy ion radiation fields. SOI microdosimeters have been previously tested in... View More

Advertisement