IEEE - Institute of Electrical and Electronics Engineers, Inc. - Goodness of Fit

Author(s): G. Booch
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2006
Volume: 23
ISSN (Paper): 0740-7459
DOI: 10.1109/MS.2006.162
Regular:

It appears to be with software architectures: for a given domain, even across the decades, forces are at play that are best resolved by a common architectural pattern that allows variants. One... View More

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