IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of grain boundaries and voids on the saturated magnetization in Fe/sub 3/O/sub 4/ films at a low magnetic field

Author(s): Ki Woong Kim ; Kap Soo Yoon ; Ja Hyun Koo ; Young Ho Do ; Chae Ok Kim ; Jin Pyo Hong
Sponsor(s): IEEE Magnetics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2006
Volume: 42
Page(s): 1,495 - 1,498
ISSN (Paper): 0018-9464
ISSN (Online): 1941-0069
DOI: 10.1109/TMAG.2006.871473
Regular:

We report the magnetic behaviors of Fe/sub 3/O/sub 4/ thin films grown by zero field growth (ZFG) and field growth (FG) techniques during the sputtering process. In FG conditions, an in situ 300... View More

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