IEEE - Institute of Electrical and Electronics Engineers, Inc. - Variation of Transistor Parameters with Temperature

Author(s): Abraham Coblenz ; Harry L. Owens
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 1952
Volume: 40
Page(s): 1,472 - 1,476
ISSN (Paper): 0096-8390
DOI: 10.1109/JRPROC.1952.273981
Regular:

In this paper results of a study to determine the temperature dependence of the electrical characteristics of Type 1698 and 1768 transistors are given. Variations of transistor parameters as a... View More

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