1.1 This test method covers procedures for measurement of metal-oxide-silicon (MOS) structures for flatband capacitance, flatband voltage, average carrier concentration within a depletion length of the semiconductor-oxide interface, displacement of flatband voltage after application of voltage st...

As a new-style stochastic algorithm, the electromagnetism-like mechanism (EM) method gains more and more attention from many researchers in recent years. A novel model based on EM (NMEM) for multiobjective optimization problems is proposed, which regards the charge of all particles as the constraint...

With the rapid development of local generation and demand response, the active distribution network (ADN), which aggregates and manages miscellaneous distributed resources, has moved from theory to practice. Secure and optimal operations now require an advanced situation awareness (SA) system so tha...

As battery technology matures, the battery energy storage system (BESS) becomes a promising candidate for addressing renewable energy uncertainties. BESS degradation is one of key factors in BESS operations, which is usually considered in the planning stage. However, BESS degradations are directly a...

The paper systematically studies the impacts of two major factors: device switching actions and inverter switching frequency on the whole EMI spectrum. Several powerful experimental results of electromagnetic interference(EMI) in voltage source inverter(VSI) with SiC and Si devices are provided. As ...