IEEE - Institute of Electrical and Electronics Engineers, Inc. - Goodness-of-fit tests based on Kullback-Leibler information

Author(s): B. Senoglu ; B. Surucu
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2004
Volume: 53
Page(s): 357 - 361
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.2004.833319
Regular:

We evaluate the power of the sample entropy goodness-of-fit tests for s-normal, exponential, and uniform distributions. We compare them with the mainstream statistical tests, the W test based on... View More

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